ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,430,132, issued on Sept. 30, was assigned to SiFive Inc. (Santa Clara, Calif.). "Technologies for interconnect address remapper with event rec... Read More
ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,430,770, issued on Sept. 30, was assigned to MOLCHIP TECHNOLOGY (SHANGHAI) Co. LTD. (Shanghai). "Image edge enhancement processing method and ... Read More
ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,432,349, issued on Sept. 30, was assigned to MediaTek Inc. (Hsinchu, Taiwan). "Method and apparatus of entropy coding for scalable video codin... Read More
ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,430,704, issued on Sept. 30, was assigned to Intel Corp. (Santa Clara, Calif.). "Level of detail via numerically stable eigenvalue technology"... Read More
ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,431,667, issued on Sept. 30, was assigned to PEGATRON Corp. (Taipei, Taiwan). "Elastic buckling element and electronic device using the same" ... Read More
ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,429,272, issued on Sept. 30, was assigned to Alcor Life Extension Foundation (Scottsdale, Ariz.). "System and method for insulated cryogenic s... Read More
ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,432,463, issued on Sept. 30, was assigned to Hainan Institute of Zhejiang University (Sanya, China), Zhejiang University (Hangzhou, China), Sha... Read More
ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,430,677, issued on Sept. 30, was assigned to Maplebear Inc. (San Francisco). "Machine-learned neural network architectures for incremental lif... Read More
ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,432,604, issued on Sept. 30, was assigned to QUALCOMM Inc. (San Diego). "Sidelink carrier aggregation" was invented by Qing Li (Princeton Junc... Read More
ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,429,780, issued on Sept. 30, was assigned to ASML Holding N.V. (Veldhoven, Netherlands). "Multiple objectives metrology system, lithographic a... Read More